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EV MCU Thermal Stress Test Machine
EV MCU Thermal Stress Test Machine
EV MCU Thermal Stress Test Machine

The EV MCU Thermal Stress Test Machine is an advanced automated test system developed to evaluate the thermal durability, functional reliability, and safety of Electric Vehicle Motor Control Units (MCUs). The machine subjects the MCU to elevated temperature conditions combined with simulated real-world vehicle operations, ensuring robust performance under actual field stresses.

Technical Specifications:

  • Machine Model: ST-400B Thermal Stress Tester
  • Test Component: EV Motor Control Unit (MCU)
  • Pre-Heating Temperature: 85°C (thermal soak before test)
  • Thermal Cut-off: 110°C (automatic safety shutdown)
  • Power Source: DC Power Supply – 48V, 210A Capacity
  • Load Bank: 4 Nos. RL Loads (configured to draw up to 210A current)
  • Control System: PLC-based automated sequencing with programmable vehicle function simulation
  • Safety Interlocks: Emergency stop, over-temperature cut-off, overload protection
  • Data Logging: Temperature, voltage, current, fault conditions (real-time logging and reporting)

Testing Methodology:

Pre-Heating:

  • The MCU is pre-conditioned to 85°C in the machine chamber.
  • Simulates under-hood thermal environment before functional testing.

Electrical Loading:

  • MCU connected to 48V / 210A DC Power Supply.
  • Power routed through 4 RL Loads simulating real-world vehicle loads.

Functional Simulation (Vehicle Conditions):

The MCU is subjected to automated control cycles replicating all major EV scooter functions to generate thermal stress:

  • Throttle Control – Acceleration demand simulation at variable speeds.
  • Regenerative Braking – Load applied through back current to simulate energy recovery.
  • Braking System Activation – Continuous brake input cycles.
  • Horn & Indicators – High-frequency auxiliary switching load.
  • Headlight & Taillight Load – Continuous lighting load simulation.
  • Side Stand Switch Operation – On/Off cycling of safety interlock circuits.
  • Battery Charging / Discharging Simulation – Current fluctuations during charge/discharge cycles.
  • Controller Idle Power Consumption – Simulated standby conditions.

Thermal Stress Monitoring:

  • MCU surface and internal temperatures monitored in real-time.
  • Continuous logging of voltage stability, current response, and thermal rise.
  • Test automatically terminates if temperature exceeds 110°C or MCU malfunctions.

Result Logging & Analysis:

  • Test results include thermal performance curves, fault history, current profile, and cut-off behavior.
  • Pass/Fail validation ensures the MCU can sustain vehicle duty cycles without breakdown.
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